Configuring an analog gain for a load test

ABSTRACT

A device may determine an analog gain for an aggregated analog signal. The aggregated analog signal may be associated with a calibration test to be used to determine a set of calibration parameters for a load test of a base station. The device may determine the set of calibration parameters for the load test based on an outcome of performing a calibration test. The set of calibration parameters may result in a set of digital gains approximately centered in a digital dynamic gain range. The device may perform the load test after determining the analog gain for the analog signal and based on the set of calibration parameters for the load test.

BACKGROUND

Load testing is the process of modeling an expected usage of computingresources by simulating a demand for the computing resources, such assimulating a quantity of simultaneous users of the computing resources.Load testing facilitates measurement of the computing resources' qualityof service performance based on expected customer behavior. To perform aload test, a tester may emulate users, devices, and/or the like.

SUMMARY

According to some possible implementations, a method may comprise:aggregating, by a device, a set of digital signals to form an aggregateddigital signal for a calibration test, wherein the aggregated digitalsignal emulates a set of user devices, wherein the calibration test isassociated with determining a set of calibration parameters for a loadtest of a base station using the set of user devices; performing, by thedevice, a conversion of the aggregated digital signal to an aggregatedanalog signal; determining, by the device, an analog gain for theaggregated analog signal; performing, by the device, the calibrationtest based on the analog gain for the aggregated analog signal; anddetermining, by the device, the set of calibration parameters for theload test based on an outcome of performing the calibration test.

According to some possible implementations, a device may comprise: oneor more memories; and one or more processors, communicatively coupled tothe one or more memories, configured to: aggregate a set of digitalsignals to form an aggregated digital signal for a calibration test,wherein the aggregated digital signal emulates a set of user devices,wherein the calibration test is associated with determining a set ofcalibration parameters for a load test of a base station using the setof user devices; determine a value of an analog gain for an aggregatedanalog signal based on aggregating the set of digital signals, whereinthe aggregated digital signal is converted to the aggregated analogsignal; perform the calibration test based on the analog gain for theaggregated analog signal; and determine the set of calibrationparameters for the load test based on an outcome of performing thecalibration test.

According to some possible implementations, a non-transitorycomputer-readable medium may store instructions, the instructionscomprising: one or more instructions that, when executed by one or moreprocessors, cause the one or more processors to: determine an analoggain for an aggregated analog signal, wherein the aggregated analogsignal is associated with a calibration test to be used to determine aset of calibration parameters for a load test of a base station; performthe calibration test after determining the analog gain for theaggregated analog signal; determine the set of calibration parametersfor the load test based on an outcome of performing the calibrationtest; and perform the load test based on the set of calibrationparameters for the load test.

BRIEF DESCRIPTION OF THE DRAWINGS

FIGS. 1A-1B are diagrams of an example implementation described herein.

FIG. 2 is a diagram of an example environment in which systems and/ormethods, described herein, may be implemented.

FIG. 3 is a diagram of example components of one or more devices of FIG.2.

FIG. 4 is a flow chart of an example process for configuring an analoggain for a load test.

FIG. 5 is a flow chart of an example process for configuring an analoggain for a load test.

FIG. 6 is a flow chart of an example process for configuring an analoggain for a load test.

FIG. 7 is a diagram related to a digital gain convergence during acalibration test described herein.

FIG. 8 is a diagram related to an expected digital gain convergenceduring a nominal load test described herein.

DETAILED DESCRIPTION

The following detailed description of example implementations refers tothe accompanying drawings. The same reference numbers in differentdrawings may identify the same or similar elements.

A software defined radio (SDR) may be used to emulate a set of userdevices for a load test. The SDR may utilize a fixed analog gain (e.g.,radio frequency (RF) gain), and may utilize digital gains to adjust arespective transmit gain of the set of user devices used during the loadtest. Configuring an optimal analog gain for the SDR may be difficultand/or inaccurate. For example, the SDR may need information related toan external RF loss between the SDR and a base station to configure theoptimal analog gain. If the SDR does not configure the optimal analoggain correctly, then the set of user devices that are being emulated mayexperience suboptimal uplink decode performance. In addition, the loadtest may not be capable of emulating the throughputs that are requestedand/or needed for the load test. Further, during a load test, if channelmodeling and/or power control are included in setup of the load test,then simulated digital gains of the set of user devices may changeduring the load test. Modification of the optimal analog gain based onthese changes may not be possible utilizing current techniques for aload test.

Some implementations described herein provide a SDR that is capable ofconfiguring an analog gain for a load test between a set of user devicesthat the SDR is emulating and a base station, such that the analog gaincan be adjusted after a calibration test based on digital gain valuesmeasured during the calibration test. In this way, the SDR can adjust RFgain for the set of user devices individually and/or more accurately toallow for different channels, such that each channel has a thresholdamount of RF gain. This improves a load test via more accurate and/ordynamic selection of an analog gain for the load test and/or of digitalgains for the load test. In addition, this improves an efficiency of aload test via automatic uplink transmission power calibration for a SDRequipped with transmitters tuned prior to the load test, that are usedto generate traffic for the set of user devices for the load test, thatare used to emulate realistic radio channel conditions, and/or the like.Further, this facilitates calibration of a load test without informationthat identifies an external RF loss between the SDR and a base station,thereby improving performance of the load test. Further, thisfacilitates use of a maximal dynamic range for digital gains for the setof user devices, thereby improving performance of the load test.

FIGS. 1A-1B are diagrams of an example implementation 100 describedherein. As shown by FIG. 1A, implementation 100 includes a SDR and abase station. Implementation 100 describes the SDR and the base stationperforming a calibration test to determine calibration parameters for aload test. In some implementations, the calibration test may be subjectto a set of design constraints. For example, the calibration test mayinclude a set of user devices (e.g., a set of user devices emulated bythe SDR), the set of user devices may attempt to establish a connectionwith the base station to establish a connected state, and thecalibration test may be performed for an amount of time that issufficient for a power control algorithm implemented by the base stationto settle the digital gains of uplink physical channels to a long-termconverged digital gain of the set of user devices. Additionally, oralternatively, assume for implementation 100 that the SDR lacksinformation identifying an external RF attenuation between the SDR andthe base station at the time of configuration of the various gainsdescribed herein.

As shown in FIG. 1A, the SDR may include a digital domain. In someimplementations, the digital domain may be associated with emulating aset of user devices (e.g., UD 1 through UD N) for the calibration testand/or for the load test. In some implementations, a user device may beassociated with a simulated digital gain applied in the digital domain.For example, the SDR may generate a digital signal to emulatetransmission by a user device, and may apply digital gain to thisdigital signal during the calibration test and/or the load test. In someimplementations, the set of user devices may include multiple userdevices. This may increase a confidence level and/or an accuracy of thecalibration test.

In some implementations, if the set of user devices includes multipleuser devices, the emulated actions of the set of user devices may bestaggered so that the set of user devices establish a desired trafficflow in a delayed manner (e.g., without overwhelming the SDR and/or thebase station in an unrealistic manner). In some implementations, if thecalibration test is associated with an interference-limited uplinkwireless scheme, such as a wideband code division multiple access(WCDMA) scheme, the SDR may perform the calibration test such that theset of user devices have a stable-state traffic pattern. Thisfacilitates maximization of a dynamic range of digital gains for thecalibration test (e.g., the dynamic range is described in more detailelsewhere herein).

As further shown in FIG. 1A, the digital domain may include a digitalanalog converter. In some implementations, the digital analog convertermay convert a digital signal generated for the set of user devices to ananalog signal to be transmitted to the base station, as describedelsewhere herein.

As shown in FIG. 1A, and by reference number 105, the SDR may generate arespective digital signal for the set of user devices for an uplinkchannel to emulate the set of user devices. For example, the SDR maygenerate a respective digital signal for a first user device for a setof uplink channels, a respective digital signal for a second user devicefor the set of uplink channels, and so forth. In some implementations,the digital signals that the SDR generates may have a respective digitalgain. For example, the SDR may generate digital signals with arespective digital gain after selecting the respective digital gain forthe digital signals. In some implementations, the digital gain appliedto the set of user devices (e.g., nominal gain to be applied to adigital signal at a start of the calibration test for a physical uplinkchannel) may be represented by the equation:g ^(i,j)where j is the physical uplink channel (e.g., j=1, . . . , M), and iidentifies a user device (e.g., 0 for user device (UD) 1, 1 for UD 2,and so forth). In some implementations, the nominal digital gain rangefor UD 1 is the interval [g_(min), g_(max)], where g_(min)=^(min)_(j)(g^(0,j)) and g_(max)=^(max) _(j)(g^(0,j)).

In some implementations, the SDR may select nominal gains g₀ ^(j) for achannel as the average long-term gains for that channel across all userdevices associated with a load test. For example, this may berepresented by the condition:g ₀ ^(j) =E[g _(∞) ^(i,j)]where E[g_(μ) ^(i,j)] is the average long-term gain across a set of userdevices for a channel.

In some implementations, when selecting a respective digital gain forthe digital signals, the SDR may select different digital gains fordifferent physical uplink channels (e.g., for long-term evolution (LTE)systems, channels such as a physical random access channel (PRACH), aphysical uplink control channel (PUCCH), a physical uplink sharedchannel (PUSCH), an uplink channel for a sounding reference signal(SRS), and/or the like). In some implementations, the SDR may select adigital gain within a dynamic range [g_(low), g_(high)]. For example,the dynamic range may be defined by fixed point precision limitations ofthe digital domain of the SDR and may be configured by default, by auser of the SDR, and/or the like prior to selection of the digital gain.In some implementations, the dynamic range may be based on an actualphysical implementation of an uplink data path between the SDR and thebase station (e.g., by limits on the digital gain permitted on theuplink data path between the SDR and the base station). In someimplementations, a size of the dynamic range may be represented by theequation:D=10 log₁₀(g _(high) /g _(low))[dB]where D is the size of the dynamic range [g_(low),g_(high)], [g_(low),g_(high)] is the dynamic range, g_(high) is the maximum of the dynamicrange, g_(low) is the minimum of the dynamic range, and dB indicates theunits, decibels, for the size of the dynamic range.

As shown by reference number 110, the SDR may aggregate digital signalsgenerated to emulate the set of user devices. For example, the SDR mayaggregate the digital signals generated to emulate the set of userdevices to form an aggregated digital signal. In some implementations,the SDR may aggregate a respective digital gain for the digital signals(e.g., into an aggregated digital gain) when aggregating the digitalsignals. In some implementations, the SDR may aggregate the digitalsignals after generating the digital signals, based on receiving inputfrom a user of the SDR to aggregate the digital signals, in subsets(e.g., may aggregate a first subset after the first subset is generated,may aggregate a second subset after the second subset is generated, andso forth), and/or the like.

As shown by reference number 115, the SDR may provide the aggregateddigital signal to the digital analog converter. For example, the SDR mayprovide the aggregated digital signal to the digital analog converterafter aggregating the digital signals generated to emulate the set ofuser devices. In some implementations, the SDR may provide theaggregated digital signal at a particular time after forming theaggregated digital signal, based on receiving input to provide theaggregated digital signal to the digital analog converter, and/or thelike.

As shown by reference number 120, the SDR may utilize the digital analogconverter to convert the aggregated digital signal to an aggregatedanalog signal. For example, the digital analog converter may convert theaggregated digital signal to an aggregated analog signal after receivingthe aggregated digital signal. In some implementations, the SDR mayutilize the digital analog converter to convert the aggregated digitalsignal into a form that the SDR can transmit to the base station. Insome implementations, the SDR may utilize the digital analog converterbased on receiving input from a user of the SDR, at a particular timeafter receiving the aggregated digital signal, and/or the like.

As shown by reference number 125, the SDR may provide the aggregatedanalog signal to an RF component associated with the SDR. For example,the SDR may provide the aggregated analog signal to the RF component tofacilitate transmission of the aggregated analog signal to the basestation, after converting the aggregated digital signal to theaggregated analog signal, based on receiving input to provide theaggregated analog signal to the RF component, and/or the like. In someimplementations, the RF component may include an RF antenna, atransceiver, a separate transmitter and receiver, and/or the like.

As shown by reference number 130, the SDR, utilizing the RF component,may select and/or apply an analog gain to the aggregated analog signal.For example, the SDR may select and/or apply an analog gain to theaggregated analog signal after converting the aggregated digital signalinto the aggregated analog signal.

In some implementations, the SDR may select the analog gain to applysuch that the base station can adjust a set of digital gains selectedfor the set of user devices. For example, the SDR may select the analoggain such that the base station can adjust the set of digital gains toadjust a respective received power for the set of user devices receivedby the base station. Continuing with the previous example, the SDR mayselect the analog gain such that the base station can adjust the set ofdigital gains by a threshold amount. Continuing still with the previousexample, the SDR may select the analog gain, such that adjustments tothe set of digital gains does not cause the digital gain to be outsideof an available range of digital gains.

As shown by reference number 135, the SDR may transmit the aggregatedanalog signal to the base station. For example, the SDR may transmit,utilizing the RF component, the aggregated analog signal with theselected analog gain and/or after applying the analog gain to theaggregated analog signal. In some implementations, the SDR may transmitthe aggregated analog signal at a particular time, after receiving inputfrom a user of the SDR, according to a schedule, and/or the like.

In some implementations, the aggregated analog signal may emulate aconnection attempt of the set of user devices to the base station. Forexample, the SDR may transmit the aggregated analog signal to emulatethe set of user devices attempting to establish a connected state to thebase station. In some implementations, the SDR may transmit theaggregated analog signal for at least a threshold amount of time. Forexample, the SDR may transmit the aggregated analog signal for an amountof time that is sufficient for the base station to utilize a powercontrol algorithm to settle the digital gains of the uplink physicalchannels to a long-term converged digital gain:g _(∞) ^(i,j)

Turning to FIG. 1B, and as shown by reference number 140, the SDR maydetermine calibration parameters for a load test and/or perform anaction after conclusion of the calibration test. For example, the SDRmay determine the calibration parameters and/or may perform the actionafter transmitting the aggregated analog signal for at least a thresholdamount of time, after completing the calibration test, and/or the like.In some implementations, the calibration parameters may include ananalog gain to be used for the load test, digital gains to be used forthe load test, and/or the like.

As shown by reference number 145, the SDR may determine the calibrationparameters and/or may perform the action based on various outcomes ofthe calibration test. For example, the SDR may determine differentcalibration parameters and/or may perform different actions fordifferent outcomes of the calibration test, may determine thecalibration parameters and/or may perform the actions in differentmanners for different outcomes of the calibration test, and/or the like.

As shown by reference number 150, the SDR may determine the calibrationparameters based on a first outcome of the calibration test (outcome 1).Assume, with regard to the first outcome, that all user devices includedin the set of user devices have connected to the base station by the endof the calibration test and that the digital gains for the uplinkphysical channels have converged to a respective non-saturated valuewithin the dynamic range. In some implementations, the SDR may determinean average long-term gain for a physical uplink channel after thecalibration test using the equation:g _(∞) ^(j) =E[g _(∞) ^(i,j)]where E[g_(∞) ^(i,j)] is the average long-term gain across user devicesfor a physical channel.

In some implementations, the SDR may determine a converged long-termgain range in dB as the interval Δ=10 log₁₀(g_(∞,max)/g_(∞,min)), whereg_(∞,max)=^(max) _(j)(g_(∞) ^(j)) and g_(∞,min)=^(min) _(j)(g_(∞) ^(j)).In some implementations, a set of nominal gains g₀ ^(j) for physicaluplink channels j=1, . . . , M can be different before the calibrationtest and after the calibration test. In some implementations, calibratednominal gains may be established during the calibration test and mayremain fixed until a subsequent calibration test is performed. Forexample, an initial nominal gain may be represented by g_(0,init) ^(j)and may be determined based on an open loop power control estimateprovided by a base station configuration. In some implementations,nominal gains may be chosen such that a nominal gain range is centeredin a middle of the digital gain range with a size of the nominal gainrange set by the open loop power control provided by the base stationconfiguration.

In some implementations, the SDR may determine the converged long-termgain range such that a converged long-term gain range is in a middle ofthe dynamic range. For example, the SDR may determine the convergedlong-term gain range such that there is an equal quantity of dBs betweena lower limit of the converged long-term gain range and the lower limitof the dynamic range, and between the upper limit of the convergedlong-term gain range and the upper limit of the dynamic range.Continuing with the previous example, the SDR may determine a gainmargin of dBs (C) at both limits of the dynamic range, such that 2C+Δ=D.

In some implementations, the SDR may determine a nominal digital gain ofa physical channel for the load test (e.g., a digital gain that is to beapplied at a start of the load test) that has a largest convergedlong-term gain based on an equation. For example, the SDR may determinethe nominal digital gain based on the equation:C=10 log₁₀(g _(high) /g _(0,max))where C is the gain margin of dBs.

In some implementations, and for the physical uplink channel that hasthe largest converged long-term gain, the SDR may determine a value ofan analog gain to be applied to an aggregated analog signal based on thefollowing condition:g _(0,max) =g _(∞) ^(j)

In some implementations, to determine the value of the analog gain (H),the SDR may determine an adjustment to a default analog gain (e.g., adefault uplink RF analog gain) (H_(def)) based on the equation:

$H = {H_{def}\frac{g_{0,\max}}{g_{\infty}^{j}}}$

In some implementations, the SDR may determine a correction value A forH based on the equation:

$A = {10{\log_{10}\left( \frac{g_{0,\max}}{g_{\infty}^{j}} \right)}}$

In this way, the SDR may determine calibration parameters based on thefirst outcome. In some implementations, the SDR may use initial nominalgains set as

$g_{0}^{i} = {g_{\infty}^{i}\left( \frac{g_{0,\max}}{g_{\infty}^{j}} \right)}$for tests following the calibration test (e.g., additional calibrationtests, a load test, and/or the like). Graphical illustration of gainconvergence and/or calibration procedure is shown in FIGS. 7-8,described elsewhere herein.

As shown by reference number 155, the SDR may perform an action based ona second outcome of the calibration test (outcome 2). For example, theSDR may perform the action after performing the calibration test, afterdetermining whether the set of user devices have established aconnection to the base station, and/or the like. Assume, with regard tothe second outcome, that digital gains for a physical uplink channelhave a threshold variance across the user devices after the calibrationtest has been performed. For example, the SDR may determine that thedigital gains have the threshold variance after the set of user deviceshave established a connection to the base station, after performing thecalibration test for at least a threshold amount of time, and/or thelike.

In some implementations, the SDR may trigger an alarm based on thedigital gains having the threshold variance (e.g., may output a sound,activate a light, provide a notification for display via a displayassociated with the SDR, and/or the like). For example, the alarm mayindicate that the calibration test and/or a power control convergence isnot stable for the physical uplink channel after performing thecalibration test. Additionally, or alternatively, the SDR may re-performthe calibration test, may request input to re-perform the calibrationtest, and/or the like to determine the calibration parameters for theload test.

In this way, the SDR may perform an action based on the second outcome.

As shown by reference number 160, the SDR may perform the action basedon a third outcome of the calibration test (outcome 3). For example, theSDR may perform the action after performing the calibration test, afterdetermining whether the set of user devices have established aconnection to the base station, and/or the like. Assume, for the thirdoutcome, that all of the user devices of the set of user devices haveestablished a connection to the base station, but that digital gains forat least one of the physical uplink channels associated with thecalibration test have converged to a value outside of the dynamic range(e.g., which can cause rounding issues when determining values of thecalibration parameters). For example, the SDR may determine that all ofuser devices of the set of user devices have connected to the basestation (e.g., during the calibration test, after performing thecalibration test for at least a threshold amount of time, and/or thelike), and the SDR may determine that the digital gains for a physicaluplink channel associated with the calibration test have converged to avalue outside of the dynamic range.

In some implementations, the SDR may perform an action based on whetherthe digital gains converged outside of an upper limit of the dynamicrange or outside of a lower limit of the dynamic range. For example,when the digital gains converge outside of the upper limit of thedynamic range, the SDR may increase the analog gain by an amount of dBs(e.g., a default amount, an amount input by a user of the SDR, and/orthe like), and may re-perform the calibration test. Additionally, oralternatively, when the digital gains converge outside of the lowerlimit of the dynamic range, the SDR may decrease the analog gain by anamount of dBs, and may re-perform the calibration test.

In this way, the SDR may perform an action based on the third action.

As shown by reference number 165, the SDR may perform the action basedon a fourth outcome of the calibration test (outcome 4). For example,the SDR may perform the action based on the calibration test resultingin the fourth outcome.

Assume, for the fourth outcome, that the digital gains converged outsideof both the upper limit of the dynamic range and the lower limit of thedynamic range in association with the calibration test. For example, theSDR may determine that the digital gains converged outside of both theupper limit of the dynamic range and the lower limit of the dynamicrange during performance of the calibration test, after the calibrationtest, and/or the like. In some implementations, the SDR may trigger analarm, may output a notification, and/or the like to indicate that thefourth outcome has occurred and/or to request manual intervention in thecalibration test (e.g., manual intervention to adjust configuration ofthe base station, such as to decrease (e.g., narrow) the needed dynamicrange). Additionally, or alternatively, the SDR may adjust configurationof the base station in this manner. In some implementations, the SDR mayre-perform the calibration test after the configuration of the basestation has been adjusted.

In this way, the SDR may perform an action based on the fourth action.

As shown by reference number 170, the SDR may perform the action basedon a fifth outcome of the calibration test (e.g., outcome 5). Forexample, the SDR may perform the action based on the calibration testresulting in the fifth outcome. Assume, for the fifth outcome, that atleast one user device of the set of user devices has not connected tothe base station in association with the calibration test. For example,the SDR may determine that at least one user device of the set of userdevices has not connected the base station during performance of thecalibration test, after performing the calibration test for a thresholdamount of time, and/or the like.

In some implementations, the SDR may trigger an alarm and/or may outputa notification to request that the user perform manual downlink and/oruplink configuration of the calibration test (e.g., to compensate forloss of the aggregated analog signal between the SDR and the basestation, to calibrate the dynamic range, and/or the like). In someimplementations, the SDR may perform the downlink and/or the uplinkconfiguration. In some implementations, the SDR may re-perform thecalibration test after the downlink and/or uplink configuration (e.g.,may re-perform the calibration test for all user devices of the set ofuser devices, may re-perform the calibration test for any user devicesof the set of user devices that failed to connect to the base station,and/or the like).

In this way, the SDR may perform an action based on the fifth outcome.

As shown by reference number 175, the SDR may perform the load test. Forexample, the SDR may perform the load test after determining thecalibration parameters for the load test. In some implementations, theSDR may perform the load test by generating a set of digital signals toemulate a set of user devices, by aggregating the set of digital signalsto form an aggregated digital signal, by converting the aggregateddigital signal to the aggregated analog signal, by applying analog gainto the aggregated analog signal, by transmitting the aggregated analogsignal to the base station, and/or the like to perform the load test.

In some implementations, the SDR may perform the load test using thecalibration parameters. For example, the SDR may perform the load testusing analog gain H, such that a nominal gain range [g_(min), g_(max)]for a digital gain is centered in a middle of an available digital gainrange. This provides a maximum digital gain margin within the availabledigital gain range [g_(low), g_(high)]. This facilitates realisticemulation of traffic on various uplink channels, such as due tomobility, fading, and/or the like (e.g., by facilitating adjustment ofdigital gains for physical uplink channels during the load test). Forexample, maximizing the digital gain range may reduce or eliminate aneed for rounding and/or saturation when modifying the digital gainduring the load test.

Continuing with the previous example, this can accommodate the largestpossible channel impairments for different user devices associated withthe load test, without causing fixed point errors. This can accommodatesituations in long-term evolution (LTE)-based load tests where,following a change in a digital gain of a physical uplink channel, thebase station drives a user device's power control so that a powerspectral density for a physical uplink channel at the base stationreceiver returns to the value driven by the nominal digital gain(without exceeding a threshold resulting by fixed-point errors).

In some implementations, the SDR may perform the load test using thecorrection value A. For example, the SDR may use the correction value Ato adjust the analog gain H for the load test. Additionally, oralternatively, the SDR may perform the load test using nominal digitalgains that are equal to the average long-term gains of an uplinkphysical channel across the set of user devices (e.g., equal to gdescribed elsewhere herein). For example, the SDR may set nominaldigital gains g₀ ^(j) equal to

${g_{\infty}^{j}\left( \frac{g_{0,\max}}{g_{\infty}^{j}} \right)}.$

In some implementations, the SDR may perform one or more actions inassociation with performing the load test. For example, the SDR mayoutput a notification that the load test is being performed and/or thatthe load test is complete. Additionally, or alternatively, and asanother example, the SDR may monitor the load test and may record datarelated to the load test (e.g., data that identifies a performance ofthe set of user devices and/or of the base station). Additionally, oralternatively, and as another example, the SDR may generate a reportrelated to the load test and may output the report for display via adisplay associated with the SDR, via a user device associated with auser of the SDR, and/or the like.

In this way, the SDR may perform a calibration test to determinecalibration parameters for a load test. For example, the SDR may performthe calibration test without information related to attenuation betweenthe SDR and the base station, without depending on an employed wirelessprotocol, regardless of a quantity and/or names of physical uplinkchannels associated with the calibration test, without regard to aparticular algorithm used by the base station for controlling power of auser device emulated by the SDR, and/or the like. This reduces oreliminates inaccurate selection of calibration parameters for the loadtest, thereby conserving time and/or processing resources that wouldotherwise be consumed performing the load test multiple times. Inaddition, this reduces or eliminates human subjectivity and/or action inpreparation of the calibration parameters for the load test. Further,this provides a way to automatically determine calibration parametersfor a load test, thereby increasing an efficiency of determiningcalibration parameters.

As indicated above, FIGS. 1A-1B are provided merely as an example. Otherexamples are possible and may differ from what was described with regardto FIGS. 1A-lB. The implementations described with regard to FIGS. 1A-1Bapply to various wireless schemes. For example, to apply theimplementations to a long-term evolution (LTE) scheme, the calibrationtest may use PUSCH and PUCCH, which may be independently powercontrolled by independent power control commands (e.g., an uplink SRSmay not be used in this case for the calibration test as the uplink SRSmay be controlled with the same power control commands as PUCCH).

FIG. 2 is a diagram of an example environment 200 in which systemsand/or methods, described herein, may be implemented. As shown in FIG.2, environment 200 may include a SDR 205, a base station 210, a mobilitymanagement entity device (MME) 215, a serving gateway (SGW) 220, apacket data network gateway (PGW) 225, a home subscriber server (HSS)230, an authentication, authorization, and accounting server (AAA) 235,and a network 240. Devices of environment 200 may interconnect via wiredconnections, wireless connections, or a combination of wired andwireless connections.

Some implementations are described herein as being performed within along term evolution (LTE) network for explanatory purposes. Someimplementations can be performed within a network that is not an LTEnetwork, such as a third generation (3G) network, a fourth generation(4G) network, a fifth generation (5G) network, etc.

Environment 200 includes an evolved packet system (EPS) that includes anLTE network and/or an evolved packet core (EPC) that operate based on athird generation partnership project (3GPP) wireless communicationstandard. The LTE network may include a radio access network (RAN) thatincludes one or more base stations 210 that take the form of evolvedNode Bs (eNBs), next generation Node Bs (gNBs), and/or the like viawhich SDR 205 communicates with the EPC. The EPC includes MME 215, SGW220, and/or PGW 225 that enable SDR 205 to communicate with network 240and/or an Internet protocol (IP) multimedia subsystem (IMS) core. TheIMS core may include HSS 230 and/or AAA 235, and can manage deviceregistration and authentication, session initiation, etc., associatedwith SDR 205. HSS 230 and/or AAA 235 can reside in the EPC and/or theIMS core.

SDR 205 includes one or more devices capable of communicating with basestation 210 and/or a network (e.g., network 240), such as to perform acalibration test, a load test, and/or the like. For example, SDR 205 mayinclude a SDR, a wireless simulator, a channel simulator, a serverdevice (e.g., in a data center), or a similar type of device. In someimplementations, SDR 205 may generate a digital signal and/or an analogsignal to emulate a set of user devices for a calibration test, a loadtest, and/or the like, as described elsewhere herein. Additionally, oralternatively, SDR 205 may determine calibration parameters for a loadtest based on a result of performing a calibration test, as describedelsewhere herein. In some implementations, a user device that SDR 205emulates may include a mobile phone (e.g., a smartphone or aradiotelephone), a laptop computer, a tablet computer, a gaming device,a wearable communication device (e.g., a smart wristwatch or a pair ofsmart eyeglasses), or a similar type of device.

Base station 210 includes one or more devices capable of transferringtraffic, such as audio, video, text, and/or other traffic, destined forand/or received from SDR 205. In some implementations, base station 210may include an eNB, a gNB, and/or the like associated with the LTEnetwork that receives traffic from and/or sends traffic to network 240via SGW 220 and/or PGW 225. Additionally, or alternatively, one or morebase stations 210 can be associated with a RAN that is not associatedwith the LTE network. Base station 210 can send traffic to and/orreceive traffic from SDR 205 via an air interface. In someimplementations, base station 210 may include a small cell base station,such as a base station of a microcell, a picocell, and/or a femtocell.

MME 215 includes one or more devices, such as one or more serverdevices, capable of managing authentication, activation, deactivation,and/or mobility functions associated with SDR 205. In someimplementations, MME 215 can perform operations relating toauthentication of SDR 205. Additionally, or alternatively, MME 215 canfacilitate the selection of a particular SGW 220 and/or a particular PGW225 to serve traffic to and/or from SDR 205. MME 215 can performoperations associated with handing off SDR 205 from a first base station210 to a second base station 210 when SDR 205 is transitioning from afirst cell associated with the first base station 210 to a second cellassociated with the second base station 210. Additionally, oralternatively, MME 215 can select another MME (not pictured), to whichSDR 205 should be handed off (e.g., when SDR 205 moves out of range ofMME 215).

SGW 220 includes one or more devices capable of routing packets. Forexample, SGW 220 may include one or more data processing and/or traffictransfer devices, such as a gateway, a router, a modem, a switch, afirewall, a network interface card (NIC), a hub, a bridge, a serverdevice, an optical add/drop multiplexer (OADM), or any other type ofdevice that processes and/or transfers traffic. In some implementations,SGW 220 can aggregate traffic received from one or more base stations210 associated with the LTE network, and can send the aggregated trafficto network 240 (e.g., via PGW 225) and/or other network devicesassociated with the EPC and/or the IMS core. SGW 220 can also receivetraffic from network 240 and/or other network devices, and can send thereceived traffic to SDR 205 via base station 210. Additionally, oralternatively, SGW 220 can perform operations associated with handingoff SDR 205 to and/or from an LTE network.

PGW 225 may include one or more devices capable of providingconnectivity for SDR 205 to external packet data networks (e.g., otherthan the depicted EPC and/or LTE network). For example, PGW 225 mayinclude one or more data processing and/or traffic transfer devices,such as a gateway, a router, a modem, a switch, a firewall, a NIC, ahub, a bridge, a server device, an OADM, or any other type of devicethat processes and/or transfers traffic. In some implementations, PGW225 can aggregate traffic received from one or more SGWs 220, and cansend the aggregated traffic to network 240. Additionally, oralternatively, PGW 225 can receive traffic from network 240, and cansend the traffic to SDR 205 via SGW 220 and base station 210. PGW 225can record data usage information (e.g., byte usage), and can providethe data usage information to AAA 235.

HSS 230 includes one or more devices, such as one or more serverdevices, capable of managing (e.g., receiving, generating, storing,processing, and/or providing) information associated with SDR 205. Forexample, HSS 230 can manage subscription information associated with SDR205, such as information that identifies a subscriber profile of a userassociated with SDR 205, information that identifies services and/orapplications that are accessible to SDR 205, location informationassociated with SDR 205, a network identifier (e.g., a network address)that identifies SDR 205, information that identifies a treatment of SDR205 (e.g., quality of service information, a quantity of minutes allowedper time period, a quantity of data consumption allowed per time period,etc.), and/or similar information. HSS 230 can provide this informationto one or more other devices of environment 200 to support theoperations performed by those devices.

AAA 235 includes one or more devices, such as one or more serverdevices, that perform authentication, authorization, and/or accountingoperations for communication sessions associated with SDR 205. Forexample, AAA 235 can perform authentication operations for SDR 205and/or a user of SDR 205 (e.g., using one or more credentials), cancontrol access, by SDR 205, to a service and/or an application (e.g.,based on one or more restrictions, such as time-of-day restrictions,location restrictions, single or multiple access restrictions,read/write restrictions, etc.), can track resources consumed by SDR 205(e.g., a quantity of voice minutes consumed, a quantity of dataconsumed, etc.), and/or can perform similar operations.

Network 240 includes one or more wired and/or wireless networks. Forexample, network 240 may include a cellular network (e.g., a long-termevolution (LTE) network, a code division multiple access (CDMA) network,a 3G network, a 4G network, a 5G network, or another type of cellularnetwork), a public land mobile network (PLMN), a local area network(LAN), a wide area network (WAN), a metropolitan area network (MAN), atelephone network (e.g., the Public Switched Telephone Network (PSTN)),a private network, an ad hoc network, an intranet, the Internet, a fiberoptic-based network, a cloud computing network, and/or the like, and/ora combination of these or other types of networks.

The number and arrangement of devices and networks shown in FIG. 2 areprovided as an example. In practice, there may be additional devicesand/or networks, fewer devices and/or networks, different devices and/ornetworks, or differently arranged devices and/or networks than thoseshown in FIG. 2. Furthermore, two or more devices shown in FIG. 2 may beimplemented within a single device, or a single device shown in FIG. 2may be implemented as multiple, distributed devices. Additionally, oralternatively, a set of devices (e.g., one or more devices) ofenvironment 200 may perform one or more functions described as beingperformed by another set of devices of environment 200.

FIG. 3 is a diagram of example components of a device 300. Device 300may correspond to SDR 205, base station 210, MME 215, SGW 220, PGW 225,HSS 230, and/or AAA 235. In some implementations, SDR 205, base station210, MME 215, SGW 220, PGW 225, HSS 230, and/or AAA 235 may include oneor more devices 300 and/or one or more components of device 300. Asshown in FIG. 3, device 300 may include a bus 310, a processor 320, amemory 330, a storage component 340, an input component 350, an outputcomponent 360, and a communication interface 370.

Bus 310 includes a component that permits communication among thecomponents of device 300. Processor 320 is implemented in hardware,firmware, or a combination of hardware and software. Processor 320 is acentral processing unit (CPU), a graphics processing unit (GPU), anaccelerated processing unit (APU), a microprocessor, a microcontroller,a digital signal processor (DSP), a field-programmable gate array(FPGA), an application-specific integrated circuit (ASIC), or anothertype of processing component. In some implementations, processor 320includes one or more processors capable of being programmed to perform afunction. Memory 330 includes a random access memory (RAM), a read onlymemory (ROM), and/or another type of dynamic or static storage device(e.g., a flash memory, a magnetic memory, and/or an optical memory) thatstores information and/or instructions for use by processor 320.

Storage component 340 stores information and/or software related to theoperation and use of device 300. For example, storage component 340 mayinclude a hard disk (e.g., a magnetic disk, an optical disk, amagneto-optic disk, and/or a solid state disk), a compact disc (CD), adigital versatile disc (DVD), a floppy disk, a cartridge, a magnetictape, and/or another type of non-transitory computer-readable medium,along with a corresponding drive.

Input component 350 includes a component that permits device 300 toreceive information, such as via user input (e.g., a touch screendisplay, a keyboard, a keypad, a mouse, a button, a switch, and/or amicrophone). Additionally, or alternatively, input component 350 mayinclude a sensor for sensing information (e.g., a global positioningsystem (GPS) component, an accelerometer, a gyroscope, and/or anactuator). Output component 360 includes a component that providesoutput information from device 300 (e.g., a display, a speaker, and/orone or more light-emitting diodes (LEDs)).

Communication interface 370 includes a transceiver-like component (e.g.,a transceiver and/or a separate receiver and transmitter) that enablesdevice 300 to communicate with other devices, such as via a wiredconnection, a wireless connection, or a combination of wired andwireless connections. Communication interface 370 may permit device 300to receive information from another device and/or provide information toanother device. For example, communication interface 370 may include anEthernet interface, an optical interface, a coaxial interface, aninfrared interface, a radio frequency (RF) interface, a universal serialbus (USB) interface, a Wi-Fi interface, a cellular network interface, orthe like.

Device 300 may perform one or more processes described herein. Device300 may perform these processes based on to processor 320 executingsoftware instructions stored by a non-transitory computer-readablemedium, such as memory 330 and/or storage component 340. Acomputer-readable medium is defined herein as a non-transitory memorydevice. A memory device includes memory space within a single physicalstorage device or memory space spread across multiple physical storagedevices.

Software instructions may be read into memory 330 and/or storagecomponent 340 from another computer-readable medium or from anotherdevice via communication interface 370. When executed, softwareinstructions stored in memory 330 and/or storage component 340 may causeprocessor 320 to perform one or more processes described herein.Additionally, or alternatively, hardwired circuitry may be used in placeof or in combination with software instructions to perform one or moreprocesses described herein. Thus, implementations described herein arenot limited to any specific combination of hardware circuitry andsoftware.

The number and arrangement of components shown in FIG. 3 are provided asan example. In practice, device 300 may include additional components,fewer components, different components, or differently arrangedcomponents than those shown in FIG. 3. Additionally, or alternatively, aset of components (e.g., one or more components) of device 300 mayperform one or more functions described as being performed by anotherset of components of device 300.

FIG. 4 is a flow chart of an example process 400 for configuring ananalog gain for a load test. In some implementations, one or moreprocess blocks of FIG. 4 may be performed by a SDR (e.g., SDR 205). Insome implementations, one or more process blocks of FIG. 4 may beperformed by another device or a group of devices separate from orincluding the SDR, such as a base station (e.g., base station 210), anMME (e.g., MME 215), a SGW (e.g., SGW 220), a PGW (e.g., PGW 225), a HSS(e.g., HSS 230), and a AAA (e.g., AAA 235).

As shown in FIG. 4, process 400 may include aggregating a set of digitalsignals to form an aggregated digital signal for a calibration test,wherein the aggregated digital signal emulates a set of user devices,wherein the calibration test is associated with determining a set ofcalibration parameters for a load test of a base station using the setof user devices (block 410). For example, the SDR (e.g., SDR 205 usingprocessor 320, and/or the like) may aggregate a set of digital signalsto form an aggregated digital signal for a calibration test, in a mannerthat is the same as or similar to that described elsewhere herein. Insome implementations, the aggregated digital signal emulates a set ofuser devices. In some implementations, the calibration test isassociated with determining a set of calibration parameters for a loadtest of a base station using the set of user devices.

As further shown in FIG. 4, process 400 may include performing aconversion of the aggregated digital signal to an aggregated analogsignal (block 420). For example, the SDR (e.g., SDR 205 using processor320) may perform a conversion of the aggregated digital signal to anaggregated analog signal, in a manner that is the same as or similar tothat described elsewhere herein.

As further shown in FIG. 4, process 400 may include determining ananalog gain for the aggregated analog signal (block 430). For example,the SDR (e.g., SDR 205 using processor 320) may determine an analog gainfor the aggregated analog signal, in a manner that is the same as orsimilar to that described elsewhere herein.

As further shown in FIG. 4, process 400 may include performing thecalibration test based on the analog gain for the aggregated analogsignal (block 440). For example, the SDR (e.g., SDR 205 using processor320, input component 350, output component 360, communication interface370, and/or the like) may perform the calibration test based on theanalog gain for the aggregated analog signal, in a manner that is thesame as or similar to that described elsewhere herein.

As further shown in FIG. 4, process 400 may include determining the setof calibration parameters for the load test based on an outcome ofperforming the calibration test (block 450). For example, the SDR (e.g.,SDR 205 using processor 320) may determine the set of calibrationparameters for the load test based on an outcome of performing thecalibration test, in a manner that is the same as or similar to thatdescribed elsewhere herein.

Process 400 may include additional implementations, such as any singleimplementation or any combination of implementations described belowand/or in connection with one or more other processes describedelsewhere herein.

In some implementations, the SDR may perform the load test based on theset of calibration parameters. In some implementations, the SDR mayselect a respective digital gain for the set of digital signals prior toaggregating the set of digital signals, wherein the respective digitalgain is within a digital gain range that is based on an uplink data pathassociated with the calibration test.

In some implementations, the respective digital gain is associated witha physical uplink channel and a user device of the set of user devices.In some implementations, the set of calibration parameters includes atleast one of: another analog gain for the load test, or another set ofnominal digital gains to be used for the load test. In someimplementations, a value of the other analog gain causes the respectivedigital gain to be approximately centered within a digital gain range,and wherein a value of the respective digital gain for the other set ofnominal digital gains is approximately equal to an average long-termgain of a physical uplink channel associated with the load test. In someimplementations, the SDR may determine that the outcome of thecalibration test includes a successful connection of the set of userdevices to the base station during the calibration test, and may performthe load test after determining that the outcome of the calibration testincludes the successful connection.

Although FIG. 4 shows example blocks of process 400, in someimplementations, process 400 may include additional blocks, fewerblocks, different blocks, or differently arranged blocks than thosedepicted in FIG. 4. Additionally, or alternatively, two or more of theblocks of process 400 may be performed in parallel.

FIG. 5 is a flow chart of an example process 500 for configuring ananalog gain for a load test. In some implementations, one or moreprocess blocks of FIG. 5 may be performed by a SDR (e.g., SDR 205). Insome implementations, one or more process blocks of FIG. 5 may beperformed by another device or a group of devices separate from orincluding the SDR, such as a base station (e.g., base station 210), aMME (e.g., MME 215), a SGW (e.g., SGW 220), a PGW (e.g., PGW 225), a HSS(e.g., HSS 230), and a AAA (e.g., AAA 235).

As shown in FIG. 5, process 500 may include aggregating a set of digitalsignals to form an aggregated digital signal for a calibration test,wherein the aggregated digital signal emulates a set of user devices,wherein the calibration test is associated with determining a set ofcalibration parameters for a load test of a base station using the setof user devices (block 510). For example, the SDR (e.g., SDR 205 usingprocessor 320, and/or the like) may aggregate a set of digital signalsto form an aggregated digital signal for a calibration test, in a mannerthat is the same as or similar to that described elsewhere herein. Insome implementations, the aggregated digital signal emulates a set ofuser devices. In some implementations, the calibration test isassociated with determining a set of calibration parameters for a loadtest of a base station using the set of user devices.

As further shown in FIG. 5, process 500 may include determining a valueof an analog gain for an aggregated analog signal based on aggregatingthe set of digital signals, wherein the aggregated digital signal isconverted to the aggregated analog signal (block 520). For example, theSDR (e.g., SDR 205 using processor 320) may determine a value of ananalog gain for an aggregated analog signal based on aggregating the setof digital signals, in a manner that is the same as or similar to thatdescribed elsewhere herein. In some implementations, the aggregateddigital signal is converted to the aggregated analog signal.

As further shown in FIG. 5, process 500 may include performing thecalibration test based on the analog gain for the aggregated analogsignal (block 530). For example, the SDR (e.g., SDR 205 using processor320, input component 350, output component 360, communication interface370, and/or the like) may perform the calibration test based on theanalog gain for the aggregated analog signal, in a manner that is thesame as or similar to that described elsewhere herein.

As further shown in FIG. 5, process 500 may include determining the setof calibration parameters for the load test based on an outcome ofperforming the calibration test (block 540). For example, the SDR (e.g.,SDR 205 using processor 320, and/or the like) may determine the set ofcalibration parameters for the load test based on an outcome ofperforming the calibration test, in a manner that is the same as orsimilar to that described elsewhere herein.

Process 500 may include additional implementations, such as any singleimplementation or any combination of implementations described belowand/or in connection with one or more other processes describedelsewhere herein.

In some implementations, the SDR may perform the load test afterdetermining the set of calibration parameters for the load test, orre-perform the calibration test using the set of calibration parameters.In some implementations, the SDR may select a respective digital gainfor the set of digital signals prior to aggregating the set of digitalsignals, wherein a value of the respective digital gain is within adigital gain range that is based on an uplink data path associated withthe calibration test.

In some implementations, the SDR may perform a set of actions based onthe outcome of performing the calibration test, wherein the set ofactions includes at least one of: performing the load test, outputting afirst notification indicating that a power control convergence of thecalibration test is not stable, outputting a second notificationindicating that a digital gain for a physical uplink channel associatedwith the calibration test has converged outside of a digital gain rangeduring the calibration test, outputting a third notification indicatingthat the digital gain range for the calibration test is to be modified,or outputting a fourth notification indicating that the set of userdevices is to be manually calibrated. In some implementations, the SDRmay perform a conversion of the aggregated digital signal to theaggregated analog signal after aggregating the set of digital signals.

In some implementations, the SDR may determine the analog gain such thatthe base station can adjust a set of digital gains to adjust arespective received power for the set of user devices. In someimplementations, the SDR may determine another analog gain for the loadtest based on the outcome of the calibration test.

Although FIG. 5 shows example blocks of process 500, in someimplementations, process 500 may include additional blocks, fewerblocks, different blocks, or differently arranged blocks than thosedepicted in FIG. 5. Additionally, or alternatively, two or more of theblocks of process 500 may be performed in parallel.

FIG. 6 is a flow chart of an example process 600 for configuring ananalog gain for a load test. In some implementations, one or moreprocess blocks of FIG. 6 may be performed by a SDR (e.g., SDR 205). Insome implementations, one or more process blocks of FIG. 6 may beperformed by another device or a group of devices separate from orincluding the SDR, such as a base station (e.g., base station 210), aMME (e.g., MME 215), a SGW (e.g., SGW 220), a PGW (e.g., PGW 225), a HSS(e.g., HSS 230), and a AAA (e.g., AAA 235).

As shown in FIG. 6, process 600 may include determining an analog gainfor an aggregated analog signal, wherein the aggregated analog signal isassociated with a calibration test to be used to determine a set ofcalibration parameters for a load test of a base station (block 610).For example, the SDR (e.g., SDR 205 using processor 320, and/or thelike) may determine an analog gain for an aggregated analog signal, in amanner that is the same as or similar to that described elsewhereherein. In some implementations, the aggregated analog signal isassociated with a calibration test to be used to determine a set ofcalibration parameters for a load test of a base station.

As further shown in FIG. 6, process 600 may include determining the setof calibration parameters for the load test based on an outcome ofperforming the calibration test, wherein the set of calibrationparameters results in a set of digital gains approximately centered in adigital dynamic gain range (block 620). For example, the SDR (e.g., SDR205 using processor 320, and/or the like) may determine the set ofcalibration parameters for the load test based on an outcome ofperforming the calibration test, in a manner that is the same as orsimilar to that described elsewhere herein. In some implementations, theset of calibration parameters results in a set of digital gainsapproximately centered in a digital dynamic gain range.

As further shown in FIG. 6, process 600 may include performing the loadtest after determining the analog gain for the aggregated analog signaland based on the set of calibration parameters for the load test (block630). For example, the SDR (e.g., SDR 205 using processor 320, inputcomponent 350, output component 360, communication interface 370, and/orthe like) may perform the load test based on the set of calibrationparameters for the load test, in a manner that is the same as or similarto that described elsewhere herein.

Process 600 may include additional implementations, such as any singleimplementation or any combination of implementations described belowand/or in connection with one or more other processes describedelsewhere herein.

In some implementations, the SDR may select a respective digital gainfor a set of digital signals prior to determining the analog gain, mayaggregate the set of digital signals to form an aggregated digitalsignal based on the respective digital gain, and may perform aconversion of the aggregated digital signal to the aggregated analogsignal. In some implementations, the SDR may perform the calibrationtest for a threshold amount of time such that the base station candetermine the set of digital gains for a set of physical channelsassociated with the calibration test.

In some implementations, the SDR may determine a value for anotheranalog gain for the load test such that the digital dynamic gain rangefor the set of digital gains for the load test is approximately centeredwithin an available digital gain range, and may determine a value of theset of digital gains based on an average long-term gain of a physicalchannel associated with the load test. In some implementations, the SDRmay determine that the outcome of performing the calibration testindicates that a set of user devices associated with the calibrationtest successfully connected to the base station, and may perform theload test after determining that the outcome of performing thecalibration test indicates that the set of user devices successfullyconnected to the base station. In some implementations, the SDR maytransmit the aggregated analog signal to the base station to emulate aset of user devices attempting to connect to the base station.

Although FIG. 6 shows example blocks of process 600, in someimplementations, process 600 may include additional blocks, fewerblocks, different blocks, or differently arranged blocks than thosedepicted in FIG. 6. Additionally, or alternatively, two or more of theblocks of process 600 may be performed in parallel.

FIG. 7 is a diagram related to a digital gain convergence during acalibration test described herein.

FIG. 7 shows digital gain convergence during a calibration test of alength of time t_(CAL). FIG. 7 shows two uplink channels j and i forexplanatory and/or illustrative purposes. In some implementations, theSDR may determine attenuation correction A [dB] such that long-termconverged digital gains g_(∞,max) and g_(∞,min) are centered in thedigital gain range and approximately equal to the initial nominal gainsg₀ ^(j) and g₀ ^(i), respectively.

As indicated above, FIG. 7 is provided merely as an example. Otherexamples are possible and may differ from what was described with regardto FIG. 7.

FIG. 8 is a diagram related to an expected digital gain convergenceduring a nominal load test described herein.

FIG. 8 shows an example of expected digital gain convergence during anominal load test of duration t_(TEST).

As indicated above, FIG. 8 is provided merely as an example. Otherexamples are possible and may differ from what was described with regardto FIG. 8.

The foregoing disclosure provides illustration and description, but isnot intended to be exhaustive or to limit the implementations to theprecise form disclosed. Modifications and variations are possible inlight of the above disclosure or may be acquired from practice of theimplementations.

As used herein, the term component is intended to be broadly construedas hardware, firmware, and/or a combination of hardware and software.

Some implementations are described herein in connection with thresholds.As used herein, satisfying a threshold may refer to a value beinggreater than the threshold, more than the threshold, higher than thethreshold, greater than or equal to the threshold, less than thethreshold, fewer than the threshold, lower than the threshold, less thanor equal to the threshold, equal to the threshold, or the like.

It will be apparent that systems and/or methods, described herein, maybe implemented in different forms of hardware, firmware, or acombination of hardware and software. The actual specialized controlhardware or software code used to implement these systems and/or methodsis not limiting of the implementations. Thus, the operation and behaviorof the systems and/or methods were described herein without reference tospecific software code—it being understood that software and hardwarecan be designed to implement the systems and/or methods based on thedescription herein.

Even though particular combinations of features are recited in theclaims and/or disclosed in the specification, these combinations are notintended to limit the disclosure of possible implementations. In fact,many of these features may be combined in ways not specifically recitedin the claims and/or disclosed in the specification. Although eachdependent claim listed below may directly depend on only one claim, thedisclosure of possible implementations includes each dependent claim incombination with every other claim in the claim set.

No element, act, or instruction used herein should be construed ascritical or essential unless explicitly described as such. Also, as usedherein, the articles “a” and “an” are intended to include one or moreitems, and may be used interchangeably with “one or more.” Furthermore,as used herein, the term “set” is intended to include one or more items(e.g., related items, unrelated items, a combination of related andunrelated items, etc.), and may be used interchangeably with “one ormore.” Where only one item is intended, the term “one” or similarlanguage is used. Also, as used herein, the terms “has,” “have,”“having,” or the like are intended to be open-ended terms. Further, thephrase “based on” is intended to mean “based, at least in part, on”unless explicitly stated otherwise.

What is claimed is:
 1. A method, comprising: aggregating, by a device, a set of digital signals to form an aggregated digital signal for a calibration test, wherein the aggregated digital signal emulates a set of user devices, wherein the calibration test is associated with determining a set of calibration parameters for a load test of a base station using the set of user devices; performing, by the device, a conversion of the aggregated digital signal to an aggregated analog signal; determining, by the device, an analog gain for the aggregated analog signal; performing, by the device, the calibration test based on the analog gain for the aggregated analog signal; and determining, by the device, the set of calibration parameters for the load test based on an outcome of performing the calibration test, wherein the set of calibration parameters includes at least another analog gain for the load test, wherein a value of the other analog gain causes a respective digital gain approximately centered within a digital gain range, and wherein a value of the respective digital gain for the other set of nominal digital gains is approximately equal to an average long-term gain of a physical uplink channel associated with the load test, wherein the average long-term gain is determined based on an open loop power control estimate provided by a base station configuration.
 2. The method of claim 1, further comprising: performing the load test based on the set of calibration parameters.
 3. The method of claim 1, further comprising: selecting the respective digital gain for the set of digital signals prior to aggregating the set of digital signals, wherein the respective digital gain is within a digital gain range that is based on an uplink data path associated with the calibration test.
 4. The method of claim 3, wherein the respective digital gain is associated with a physical uplink channel and a user device of the set of user devices.
 5. The method of claim 1, wherein the set of calibration parameters also includes another set of nominal digital gains used for the load test.
 6. The method of claim 1, further comprising: determining that the outcome of the calibration test includes a successful connection of the set of user devices to the base station during the calibration test; and performing the load test after determining that the outcome of the calibration test includes the successful connection.
 7. The method of claim 1, further comprising: performing a set of actions based on the outcome of performing the calibration test, wherein the set of actions includes at least one of: performing the load test, outputting a first notification indicating that a power control convergence of the calibration test is not stable, outputting a second notification indicating that a digital gain for a physical uplink channel associated with the calibration test has converged outside of a digital gain range during the calibration test, outputting a third notification indicating that the digital gain range for the calibration test is to be modified, or outputting a fourth notification indicating that the set of user devices is to be manually calibrated.
 8. A device, comprising: one or more memories; and one or more processors, communicatively coupled to the one or more memories, configured to: aggregate a set of digital signals to form an aggregated digital signal for a calibration test, wherein the aggregated digital signal emulates a set of user devices, wherein the calibration test is associated with determining a set of calibration parameters for a load test of a base station using the set of user devices; determine a value of an analog gain for an aggregated analog signal based on aggregating the set of digital signals, wherein the aggregated digital signal is converted to the aggregated analog signal; perform the calibration test based on the analog gain for the aggregated analog signal; and determine the set of calibration parameters for the load test based on an outcome of performing the calibration test, wherein the set of calibration parameters includes at least another analog gain for the load test, wherein a value of the other analog gain causes an approximate centering of a respective digital gain within a digital gain range, and wherein a value of the respective digital gain for the other set of nominal digital gains is approximately equal to an average long-term gain of a physical uplink channel associated with the load test,  wherein the average long-term gain is determined based on an open loop power control estimate provided by a base station configuration.
 9. The device of claim 8, wherein the one or more processors are further configured to: perform the load test after determining the set of calibration parameters for the load test, or re-perform the calibration test using the set of calibration parameters.
 10. The device of claim 8, wherein the one or more processors are further configured to: select the respective digital gain for the set of digital signals prior to aggregating the set of digital signals, wherein the value of the respective digital gain is within a digital gain range that is based on an uplink data path associated with the calibration test.
 11. The device of claim 8, wherein the one or more processors are further configured to: perform a set of actions based on the outcome of performing the calibration test, wherein the set of actions includes at least one of: performing the load test, outputting a first notification indicating that a power control convergence of the calibration test is not stable, outputting a second notification indicating that a digital gain for a physical uplink channel associated with the calibration test has converged outside of a digital gain range during the calibration test, outputting a third notification indicating that the digital gain range for the calibration test is to be modified, or outputting a fourth notification indicating that the set of user devices is to be manually calibrated.
 12. The device of claim 8, wherein the one or more processors are further configured to: perform a conversion of the aggregated digital signal to the aggregated analog signal after aggregating the set of digital signals.
 13. The device of claim 8, wherein the one or more processors, when determining the analog gain for the aggregated analog signal, are configured to: determine the analog gain to enable the base station to adjust a set of digital gains to adjust a respective received power for the set of user devices.
 14. The device of claim 8, wherein the one or more processors are further configured to: determine that the outcome of the calibration test includes a successful connection of the set of user devices to the base station during the calibration test; and perform the load test after determining that the outcome of the calibration test includes the successful connection.
 15. A non-transitory computer-readable medium storing instructions, the instructions comprising: one or more instructions that, when executed by one or more processors, cause the one or more processors to: determine an analog gain for an aggregated analog signal, wherein the aggregated analog signal is associated with a calibration test to determine a set of calibration parameters for a load test of a base station; determine the set of calibration parameters for the load test based on an outcome of performing the calibration test, wherein the set of calibration parameters results in a set of digital gains approximately centered in a digital dynamic gain range, and wherein the values of the set of digital gains are approximately equal to an average long-term gain of a physical uplink channel associated with a load test, wherein the average long-term gain is determined based on an open loop power control estimate provided by a base station configuration; and perform the load test after determining the analog gain for the aggregated analog signal and based on the set of calibration parameters for the load test.
 16. The non-transitory computer-readable medium of claim 15, wherein the one or more instructions, when executed by the one or more processors, further cause the one or more processors to: select a respective digital gain for a set of digital signals prior to determining the analog gain; aggregate the set of digital signals to form an aggregated digital signal based on the respective digital gain; and perform a conversion of the aggregated digital signal to the aggregated analog signal.
 17. The non-transitory computer-readable medium of claim 15, wherein the one or more instructions, when executed by the one or more processors, further cause the one or more processors to: perform the calibration test for a threshold amount of time to enable the base station to determine the set of digital gains for a set of physical channels associated with the calibration test.
 18. The non-transitory computer-readable medium of claim 15, wherein the one or more instructions, that cause the one or more processors to determine the set of calibration parameters, cause the one or more processors to: determine a value for another analog gain for the load test such that the digital dynamic gain range for the set of digital gains for the load test is approximately centered within an available digital gain range; and determine a value of the set of digital gains based on an average long-term gain of a physical channel associated with the load test.
 19. The non-transitory computer-readable medium of claim 15, wherein the one or more instructions, when executed by the one or more processors, further cause the one or more processors to: determine that the outcome of performing the calibration test indicates that a set of user devices associated with the calibration test successfully connected to the base station; and wherein the one or more instructions, that cause the one or more processors to perform the load test, cause the one or more processors to: perform the load test after determining that the outcome of performing the calibration test indicates that the set of user devices successfully connected to the base station.
 20. The non-transitory computer-readable medium of claim 15, wherein the one or more instructions, that cause the one or more processors to perform the calibration test, cause the one or more processors to: transmit the aggregated analog signal to the base station to emulate a set of user devices attempting to connect to the base station. 